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Proceedings Paper

Reshaping and polishing the GeMS MCAO system
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Paper Abstract

GeMS, the Gemini South MCAO System, has now been in operation for 3 years with the near infrared imager GSAOI. We first review the performance obtained by the system, the science cases and the current operational model. In the very near future, GeMS will undergo a profound metamorphosis, as we will integrate a new NGS wavefront sensor, replace the current 50W laser with a more robust one and prepare for a new operational model where operations will shift from the mountain to the base facility. Along this major evolution, we are also presenting several improvements on the loop control, calibrations and automatization of this complex system. We discuss here the progress of the different upgrades and what we expect in terms of performance improvements and operational efficiency.

Paper Details

Date Published: 27 July 2016
PDF: 9 pages
Proc. SPIE 9909, Adaptive Optics Systems V, 99092F (27 July 2016); doi: 10.1117/12.2233747
Show Author Affiliations
Vincent Garrel, Gemini Observatory (Chile)
Gaetano Sivo, Gemini Observatory (Chile)
Eduardo Marin, Gemini Observatory (Chile)
Eleazar R. Carrasco Damele, Gemini Observatory (Chile)
Vanessa Montes, Gemini Observatory (Chile)
Manuel Lazo, Gemini Observatory (Chile)
Pedro Gigoux, Gemini Observatory (Chile)
Cristian Moreno, Gemini Observatory (Chile)
Chadwick A. Trujillo, Gemini Observatory (United States)
Jeff Donahue, Gemini Observatory (United States)
Marcos A. van Dam, Flat Wavefronts (New Zealand)
Francois Rigaut, Australian National Univ. (Australia)
Céline d'Orgeville, Australian National Univ. (Australia)
Caroline Kulcsar, Institut d'Optique Graduate School (France)
Remy Juvénal, Institut d'Optique Graduate School (France)
Constanza Araujo Hauck, The Large Synoptic Survey Telescope (United States)
S. Mark Ammons, Lawrence Livermore National Lab. (United States)
Benoit Neichel, Lab. d'Astrophysique de Marseille (France)

Published in SPIE Proceedings Vol. 9909:
Adaptive Optics Systems V
Enrico Marchetti; Laird M. Close; Jean-Pierre Véran, Editor(s)

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