
Proceedings Paper
MMP, the Multi Mini Prism device for ESPRESSO APSU: prototyping and integrationFormat | Member Price | Non-Member Price |
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Paper Abstract
slicer, is necessary to differently fold each field to correctly illuminate the echelle and this is made by cylindrical prisms glued onto a silica window. We present the integrated robotic system conceived to reach the required tolerances in term of alignment and integration. It consists in a tip/tilt stage to select the wedge angle, a rotational stage to select the right clock angle, coupled to an x-y stage to position the elements on the window and a z axis to perform the gluing.
Paper Details
Date Published: 9 August 2016
PDF: 11 pages
Proc. SPIE 9908, Ground-based and Airborne Instrumentation for Astronomy VI, 990872 (9 August 2016); doi: 10.1117/12.2233477
Published in SPIE Proceedings Vol. 9908:
Ground-based and Airborne Instrumentation for Astronomy VI
Christopher J. Evans; Luc Simard; Hideki Takami, Editor(s)
PDF: 11 pages
Proc. SPIE 9908, Ground-based and Airborne Instrumentation for Astronomy VI, 990872 (9 August 2016); doi: 10.1117/12.2233477
Show Author Affiliations
Luca Oggioni, INAF - Osservatorio Astronomico di Brera (Italy)
Politecnico di Milano (Italy)
G. Pariani, INAF - Osservatorio Astronomico di Brera (Italy)
M. Moschetti, INAF - Osservatorio Astronomico di Brera (Italy)
M. Riva, INAF - Osservatorio Astronomico di Brera (Italy)
Politecnico di Milano (Italy)
G. Pariani, INAF - Osservatorio Astronomico di Brera (Italy)
M. Moschetti, INAF - Osservatorio Astronomico di Brera (Italy)
M. Riva, INAF - Osservatorio Astronomico di Brera (Italy)
M. Genoni, INAF - Osservatorio Astronomico di Brera (Italy)
M. Aliverti, INAF - Osservatorio Astronomico di Brera (Italy)
M. Landoni, INAF - Osservatorio Astronomico di Brera (Italy)
M. Aliverti, INAF - Osservatorio Astronomico di Brera (Italy)
M. Landoni, INAF - Osservatorio Astronomico di Brera (Italy)
Published in SPIE Proceedings Vol. 9908:
Ground-based and Airborne Instrumentation for Astronomy VI
Christopher J. Evans; Luc Simard; Hideki Takami, Editor(s)
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