
Proceedings Paper
Manufacturing and coating of optical components for the EnMAP hyperspectral imagerFormat | Member Price | Non-Member Price |
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Paper Abstract
The optical system of the hyperspectral imager of the Environmental Mapping and Analysis Program (EnMAP) consists of a three-mirror anastigmat (TMA) and two independent spectrometers working in the VNIR and SWIR spectral range, respectively. The VNIR spectrometer includes a spherical NiP coated Al6061 mirror that has been ultra-precisely diamond turned and finally coated with protected silver as well as four curved fused silica (FS) and flint glass (SF6) prisms, respectively, each with broadband antireflection (AR) coating, while the backs of the two outer prisms are coated with a high-reflective coating. For AR coating, plasma ion assisted deposition (PIAD) has been used; the high-reflective enhanced Ag-coating on the backside has been deposited by magnetron sputtering. The SWIR spectrometer contains four plane and spherical gold-coated mirrors, respectively, and two curved FS prisms with a broadband antireflection coating. Details about the ultra-precise manufacturing of metal mirrors and prisms as well as their coating are presented in this work.
Paper Details
Date Published: 22 July 2016
PDF: 7 pages
Proc. SPIE 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 991230 (22 July 2016); doi: 10.1117/12.2232914
Published in SPIE Proceedings Vol. 9912:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
Ramón Navarro; James H. Burge, Editor(s)
PDF: 7 pages
Proc. SPIE 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 991230 (22 July 2016); doi: 10.1117/12.2232914
Show Author Affiliations
M. Schürmann, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
D. Gäbler, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
R. Schlegel, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
S. Schwinde, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
T. Peschel, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
C. Damm, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
R. Jende, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
J. Kinast, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
D. Gäbler, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
R. Schlegel, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
S. Schwinde, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
T. Peschel, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
C. Damm, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
R. Jende, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
J. Kinast, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
S. Müller, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
M. Beier, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
S. Risse, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
B. Sang, OHB-System AG (Germany)
M. Glier, OHB-System AG (Germany)
H. Bittner, OHB-System AG (Germany)
M. Erhard, OHB-System AG (Germany)
M. Beier, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
S. Risse, Fraunhofer-Institute for Applied Optics and Precision Engineering IOF (Germany)
B. Sang, OHB-System AG (Germany)
M. Glier, OHB-System AG (Germany)
H. Bittner, OHB-System AG (Germany)
M. Erhard, OHB-System AG (Germany)
Published in SPIE Proceedings Vol. 9912:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
Ramón Navarro; James H. Burge, Editor(s)
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