The radiation damage effects from the harsh radiative environment outside the Earth's atmosphere can be a cause for concern for most space missions. With the science goals becoming ever more demanding, the requirements on the precision of the instruments on board these missions also increases, and it is therefore important to investigate how the radiation induced damage affects the Charge-Coupled Devices (CCDs) that most of these instruments rely on. The primary goal of the Euclid mission is to study the nature of dark matter and dark energy using weak lensing and baryonic acoustic oscillation techniques. The weak lensing technique depends on very precise shape measurements of distant galaxies obtained by a large CCD array. It is anticipated that over the 6 year nominal lifetime of mission, the CCDs will be degraded to an extent that these measurements will not be possible unless the radiation damage effects are corrected. We have therefore created a Monte Carlo model that simulates the physical processes taking place when transferring signal through a radiation damaged CCD. The software is based on Shockley-Read-Hall theory, and is made to mimic the physical properties in the CCD as close as possible. The code runs on a single electrode level and takes charge cloud size and density, three dimensional trap position, and multi-level clocking into account. A key element of the model is that it takes device specific simulations of electron density as a direct input, thereby avoiding to make any analytical assumptions about the size and density of the charge cloud. This paper illustrates how test data and simulated data can be compared in order to further our understanding of the positions and properties of the individual radiation-induced traps.

Date Published: 27 July 2016
PDF: 10 pages
Proc. SPIE 9915, High Energy, Optical, and Infrared Detectors for Astronomy VII, 991529 (27 July 2016); doi: 10.1117/12.2232696

Published in SPIE Proceedings Vol. 9915:
High Energy, Optical, and Infrared Detectors for Astronomy VII
Andrew D. Holland; James Beletic, Editor(s)