The research works are summarized for Φ1.1m off-axis aspheric segments which are scaled-down TMT segments polished by NIAOT using SMAP (Stressed Mirror Annular Polishing) method in the previous phase and testing preparations for 1.45m mirrors. The detailed introduction is given on result of errors analysis in contact detection testing of segments. In the second part, the selected basis of sampling number for contact-type detector arrays and the terms number of Zernike polynomials we need are studied. And the situations on orthogonality destruction of Zernike polynomials in discrete points sampling case and spectral analysis for each order Spherical aberrations in continuous sampling are introduced.

Date Published: 22 July 2016
PDF: 12 pages
Proc. SPIE 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 99120B (22 July 2016); doi: 10.1117/12.2232200

Published in SPIE Proceedings Vol. 9912:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
Ramón Navarro; James H. Burge, Editor(s)