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Proceedings Paper

The 4MOST Operations System
Author(s): Tom Dwelly; Andrea Merloni; Jakob C. Walcher; Nicolas Clerc; Alain Gueguen; Thomas Boller; Roelof S. de Jong; Cristina Chiappini
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Paper Abstract

The 4MOST multi-object spectroscopic instrument (to be mounted on the ESO/VISTA telescope) will be used to conduct an ambitious multi-year wide area sky survey. A disparate set of science goals, requiring observation of tens of millions of galactic and extragalactic targets, must be satisfied by a unified program of observations. The 4MOST Operations System is designed to facilitate this complex task by i) providing sophisticated simulation tools that allow the science team to plan and optimise the 4MOST survey, ii) carrying out optimised mediumterm scheduling using survey forecasting tools and feedback from previous observations, and iii) producing sets of observation blocks ready for execution at the telescope. We present an overview of the Operations System, highlighting the advanced facility simulator tool and the novel strategies that will enable 4MOST to achieve its challenging science goals.

Paper Details

Date Published: 15 July 2016
PDF: 19 pages
Proc. SPIE 9910, Observatory Operations: Strategies, Processes, and Systems VI, 99101Q (15 July 2016); doi: 10.1117/12.2231855
Show Author Affiliations
Tom Dwelly, Max-Planck-Institut für extraterrestrische Physik (Germany)
Andrea Merloni, Max-Planck-Institut für extraterrestrische Physik (Germany)
Jakob C. Walcher, Leibniz-Institut für Astrophysik Potsdam (Germany)
Nicolas Clerc, Max-Planck-Institut für extraterrestrische Physik (Germany)
Alain Gueguen, Max-Planck-Institut für extraterrestrische Physik (Germany)
Thomas Boller, Max-Planck-Institut für extraterrestrische Physik (Germany)
Roelof S. de Jong, Leibniz-Institut für Astrophysik Potsdam (Germany)
Cristina Chiappini, Leibniz-Institut für Astrophysik Potsdam (Germany)

Published in SPIE Proceedings Vol. 9910:
Observatory Operations: Strategies, Processes, and Systems VI
Alison B. Peck; Robert L. Seaman; Chris R. Benn, Editor(s)

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