
Proceedings Paper
Research on aided navigation based on terrain elevation matching and simulationFormat | Member Price | Non-Member Price |
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Paper Abstract
The matching function of terrain-aided navigation is not only related to the algorithm, also associated with the terrain characteristics of matching area. Aiming at terrain matching area selection and matching algorithm of the terrain height matching system, the method of terrain information entropy is put forward on the basis of statistical characteristics of the terrain roughness, signal-to-noise ratio, and then COR algorithm, MAD algorithm, MSD algorithm is adopted for real-time map and reference map matching, finally shows the simulation comparison of three kinds of matching algorithm. Result of simulation shows that among the index of matching accuracy and speed of three kinds of algorithm, COR algorithm possess fastest calculation speed and lowest precision, matching accuracy of MSD is slightly higher than MAD algorithm and calculation speed of MSD is placed in the middle, and the simulation results provide selection basis for terrain-aided inertial navigation.
Paper Details
Date Published: 26 January 2016
PDF: 6 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962X (26 January 2016); doi: 10.1117/12.2230690
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
PDF: 6 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962X (26 January 2016); doi: 10.1117/12.2230690
Show Author Affiliations
Yanping He, Xi’an Institute of High Technology (China)
Xinxue Liu, Xi’an Institute of High Technology (China)
Xinxue Liu, Xi’an Institute of High Technology (China)
Yanping Cai, Xi’an Institute of High Technology (China)
Xi’an Jiaotong Univ. (China)
Yu Zhu, Xi’an Institute of High Technology (China)
Xi’an Jiaotong Univ. (China)
Yu Zhu, Xi’an Institute of High Technology (China)
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
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