Proceedings Paper
X-ray pulsar navigation precision analysis considering orbit propagation error effects| Format | Member Price | Non-Member Price |
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Paper Abstract
Orbit propagation error effects are considered in precision analysis of X-ray pulsar navigation (XNAV) systems which integrating orbit dynamics model and pulse time of arrival observation. Precision analysis model is established, and the concept of optimal pulse observation accumulation time is proposed based on coupling analysis of orbit propagation error, pulsar observation process and pulse time of arrival observation precision. The estimation algorithm of optimal observation accumulation time is presented as an important tool for XNAV observation planning and scheme design.
Paper Details
Date Published: 26 January 2016
PDF: 8 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 979620 (26 January 2016); doi: 10.1117/12.2230229
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
PDF: 8 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 979620 (26 January 2016); doi: 10.1117/12.2230229
Show Author Affiliations
Heng Shi, Beijing Institute of Control Engineering (China)
Science and Technology on Space Intelligence Control Lab. (China)
Kai Xiong, Beijing Institute of Control Engineering (China)
Science and Technology on Space Intelligence Control Lab. (China)
Chunling Wei, Beijing Institute of Control Engineering (China)
Science and Technology on Space Intelligence Control Lab. (China)
Science and Technology on Space Intelligence Control Lab. (China)
Kai Xiong, Beijing Institute of Control Engineering (China)
Science and Technology on Space Intelligence Control Lab. (China)
Chunling Wei, Beijing Institute of Control Engineering (China)
Science and Technology on Space Intelligence Control Lab. (China)
Lei Wang, Beijing Institute of Control Engineering (China)
Zhiwu Mei, Beijing Institute of Control Engineering (China)
Zhiwu Mei, Beijing Institute of Control Engineering (China)
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
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