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Proceedings Paper

Raman mapping of intact biofilms on stainless steel surfaces
Author(s): Julie K. Nguyen; Lynne Heighton; Yunfeng Xu; Xiangwu Nou; Walter F. Schmidt
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Paper Abstract

Many issues occur when microbial bacteria contaminates human food or water; it can be dangerous to the public. Determining how the microbial are growing, it can help experts determine how to prevent the outbreaks. Biofilms are a tightly group of microbial cells that grow on living surfaces or surrounding themselves. Though biofilms are not necessarily uniform; when there are more than one type of microbial bacteria that are grown, Raman mapping is performed to determine the growth patterns. Depending on the type of microbial bacteria, they can grow in various patterns such as symmetrical or scattered on the surface. The biofilms need to be intact in order to preclude and potentially figuring out the relative intensity of different components in a biofilm mixture. In addition, it is important to determine whether one biofilms is a substrate for another biofilm to be detected. For example, it is possible if layer B appears above layer A, but layer A doesn’t appear above layer B. In this case, three types of biofilms that are grown includes Listeria(L), Ralstonia(R), and a mixture of the two (LR). Since microbe deposits on metal surfaces are quite suitable, biofilms were grown on stainless steel surface slides. Each slide was viewed under a Raman Microscope at 100X and using a 532nm laser to provide great results and sharp peaks. The mapping of the laser helps determine how the bacteria growth, at which intensity the bacteria appeared in order to identify specific microbes to signature markers on biofilms.

Paper Details

Date Published: 17 May 2016
PDF: 7 pages
Proc. SPIE 9864, Sensing for Agriculture and Food Quality and Safety VIII, 986415 (17 May 2016); doi: 10.1117/12.2229808
Show Author Affiliations
Julie K. Nguyen, Agricultural Research Service, USDA (United States)
Lynne Heighton, Agricultural Research Service, USDA (United States)
Yunfeng Xu, Agricultural Research Service, USDA (United States)
Xiangwu Nou, Agricultural Research Service, USDA (United States)
Walter F. Schmidt, Agricultural Research Service, USDA (United States)

Published in SPIE Proceedings Vol. 9864:
Sensing for Agriculture and Food Quality and Safety VIII
Moon S. Kim; Kuanglin Chao; Bryan A. Chin, Editor(s)

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