
Proceedings Paper
Research on absorption test methods of Yb-doped double cladding fiberFormat | Member Price | Non-Member Price |
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Paper Abstract
Absorption coefficient is a very useful feature for active fiber. In fiber laser system, the length of active fiber is chosen according to absorption coefficient. And the length of fiber can directly influence the feature of fiber laser. Therefore, how to obtain an accurate absorption coefficient is very important. Because fiber exists re-emission in typical absorption band pumped by power. It is difficult to accurately measure absorption coefficient. The absorption coefficients of Yb-doped double cladding fiber at 975 nm measured by several methods were compared. In conclusion, for the fibers with same length pumped by white light, the absorption coefficient is the highest when cutback only once. Meanwhile, when fibers with different length were measured by the same method, the absorption coefficient is inversely proportional to optical fiber length.
Paper Details
Date Published: 26 January 2016
PDF: 4 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962H (26 January 2016); doi: 10.1117/12.2229724
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
PDF: 4 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962H (26 January 2016); doi: 10.1117/12.2229724
Show Author Affiliations
Pupu Wang, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Rundong Li, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Liang Rong, The 23rd Research Insititute,CETC (China)
Wei Ji, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
TXStar Laser Technology Co., Ltd. (China)
Rundong Li, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Liang Rong, The 23rd Research Insititute,CETC (China)
Wei Ji, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Yankun Gao, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Cong Jiang, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Shaoyi Gu, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
TXStar Laser Technology Co., Ltd. (China)
Cong Jiang, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Shaoyi Gu, China Electronics Technology Group Corp. (China)
TXStar Laser Technology Co., Ltd. (China)
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
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