
Proceedings Paper
Recent development of SWIR focal plane array with InGaAs/GaAsSb type-II quantum wellsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
HgCdTe (MCT) is predominantly used for infrared imaging applications even in SWIR region. However, MCT is
expensive and contains environmentally hazardous substances. Therefore, its application has been restricted mainly
military and scientific use and was not spread to commercial use. InGaAs/GaAsSb type-II quantum well structures are
considered as an attractive material for realizing low dark current PDs owing to lattice-matching to InP substrate. Moreover,
III-V compound material systems are suitable for commercial use. In this report, we describe successful operation of focal
plane array (FPA) with InGaAs/GaAsSb quantum wells and mention improvement of optical characteristics. Planar type
pin-PDs with 250-pairs InGaAs(5nm)/GaAsSb(5nm) quantum well absorption layer were fabricated. The p-n junction was
formed in the absorption layer by the selective diffusion of zinc. Electrical and optical characteristics of FPA or pin-PDs
were investigated. Dark current of 1μA/cm2 at 210K, which showed good uniformity and led to good S/N ratio in SWIR
region, was obtained. Further, we could successfully reduce of stray light in the cavity of FPA with epoxy resin. As a
result, the clear image was taken with 320x256 format and 7% contrast improvement was achieved. Reliability test of
10,000 heat cycles was carried out. No degradations were found in FPA characteristics of the epoxy coated sample. This
result means FPA using InGaAs/GaAsSb type-II quantum wells is a promising candidate for commercial applications.
Paper Details
Date Published: 17 June 2016
PDF: 7 pages
Proc. SPIE 9819, Infrared Technology and Applications XLII, 98190C (17 June 2016); doi: 10.1117/12.2229591
Published in SPIE Proceedings Vol. 9819:
Infrared Technology and Applications XLII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)
PDF: 7 pages
Proc. SPIE 9819, Infrared Technology and Applications XLII, 98190C (17 June 2016); doi: 10.1117/12.2229591
Show Author Affiliations
Hiroshi Inada, Sumitomo Electric Industries, Ltd. (Japan)
Kenichi Machinaga, Sumitomo Electric Industries, Ltd. (Japan)
Sundararajan Balasekaran, Sumitomo Electric Industries, Ltd. (Japan)
Kouhei Miura, Sumitomo Electric Industries, Ltd. (Japan)
Kenichi Machinaga, Sumitomo Electric Industries, Ltd. (Japan)
Sundararajan Balasekaran, Sumitomo Electric Industries, Ltd. (Japan)
Kouhei Miura, Sumitomo Electric Industries, Ltd. (Japan)
Takahiko Kawahara, Sumitomo Electric Industries, Ltd. (Japan)
Masaki Migita, Sumitomo Electric Industries, Ltd. (Japan)
Katsushi Akita, Sumitomo Electric Industries, Ltd. (Japan)
Yasuhiro Iguchi, Sumitomo Electric Industries, Ltd. (Japan)
Masaki Migita, Sumitomo Electric Industries, Ltd. (Japan)
Katsushi Akita, Sumitomo Electric Industries, Ltd. (Japan)
Yasuhiro Iguchi, Sumitomo Electric Industries, Ltd. (Japan)
Published in SPIE Proceedings Vol. 9819:
Infrared Technology and Applications XLII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)
© SPIE. Terms of Use
