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Proceedings Paper

Silicon nanophotonic networks for quantum optical information processing
Author(s): Edwin E. Hach III
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Paper Abstract

Silicon nanophotonics show a lot of promise as the basic architecture for quantum information processing devices. This is particularly the case in relation to the scalability of such devices. During this talk I will review our simple theoretical model of a structure that we have identified as a ‘fundamental circuit element’ for linear optical quantum information processing in silicon nanophotonics. In particular, we have shown that, owing to an effect we call Passive Quantum Optical Feedback (PQOF), the topology of this circuit element allows for certain possible operational advantages, in addition to inherent scalability, not expected in bulk linear optics. I will emphasize the extension of our work to larger networks, including the Knill-Laflamme-Milburn (KLM) Controlled-Not (CNOT) gate and its important constituent, the so-called Nonlinear Sign (NS) shifter. Further, I will discuss our ongoing effort to design and optimize scalable networks that seem to have useful applications in quantum metrology and sensing. In developing the discussion, I will examine recent developments related to incorporation of losses and spectral properties in such a way as to generalize our simple, continuous-wave (cw) model of essentially lossless operation. I will also discuss on-chip generation and control of entangled photons within the nanophotonic material itself, especially as related to potentially useful applications in information processing.

Paper Details

Date Published: 12 May 2016
PDF: 20 pages
Proc. SPIE 9850, Machine Intelligence and Bio-inspired Computation: Theory and Applications X, 98500D (12 May 2016); doi: 10.1117/12.2229051
Show Author Affiliations
Edwin E. Hach III, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9850:
Machine Intelligence and Bio-inspired Computation: Theory and Applications X
Misty Blowers; Jonathan Williams; Russell D. Hall, Editor(s)

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