
Proceedings Paper
The simulation for the temporal characteristic of the microchannel plateFormat | Member Price | Non-Member Price |
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Paper Abstract
Framing cameras based on the gated microchannel plate (MCP) are versatile diagnostic tools for fast Z-pinch and inertial confinement fusion experiments. In order to understand the temporal characteristic of the MCP used in such camera, the MCP is simulated using the Monte Carlo method. By simulating the electron cascade in the MCP, the relationship between the MCP temporal resolution and the ratio of its thickness to the channel diameter (L/D ratio) is obtained. The variation of the temporal resolution with the voltage applied on the MCP is also provided. The transit time and the transit time spread (TTS) simulations of the MCP are presented. The simulated results show that the transit time and TTS of the MCP are increased with L/D ratio increasing while the channel diameter of the MCP is 10 um.
Paper Details
Date Published: 26 January 2016
PDF: 6 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962E (26 January 2016); doi: 10.1117/12.2228717
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
PDF: 6 pages
Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962E (26 January 2016); doi: 10.1117/12.2228717
Show Author Affiliations
Houzhi Cai, Shenzhen Univ. (China)
Jinghua Long, Shenzhen Univ. (China)
Jinyuan Liu, Shenzhen Univ. (China)
Weixin Xie, Shenzhen Univ. (China)
Jinghua Long, Shenzhen Univ. (China)
Jinyuan Liu, Shenzhen Univ. (China)
Weixin Xie, Shenzhen Univ. (China)
Yanli Bai, Shenzhen Univ. (China)
Yunfei Lei, Shenzhen Univ. (China)
Yubo Liao, Shenzhen Univ. (China)
Pengfei Li, Air Defense Forces Academy (China)
Yunfei Lei, Shenzhen Univ. (China)
Yubo Liao, Shenzhen Univ. (China)
Pengfei Li, Air Defense Forces Academy (China)
Published in SPIE Proceedings Vol. 9796:
Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
Weimin Bao; Yueguang Lv, Editor(s)
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