
Proceedings Paper
Accuracy analysis of the Null-Screen method for the evaluation of flat heliostatsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
In this work we develop an algorithm to determinate the accuracy of the Null-Screen Method, used for the testing of flat heliostats used as solar concentrators in a central tower configuration. We simulate the image obtained on a CCD camera when an orderly distribution of points are displayed on a Null-Screen perpendicular to the heliostat under test. The deformations present in the heliostat are represented as a cosine function of the position with different periods and amplitudes. As a resolution criterion, a deformation on the mirror can be detected when the differences in position between the spots on the image plane for the deformed surface as compared with those obtained for an ideally flat heliostat are equal to one pixel. For 6.4μm pixel size and 18mm focal length, the minimum deformation we can measure in the heliostat, correspond to amplitude equal a 122μm for a period equal to 1m; this is equivalent to 0.8mrad in slope. This result depends on the particular configuration used during the test and the size of the heliostat.
Paper Details
Date Published: 29 April 2016
PDF: 10 pages
Proc. SPIE 9898, Photonics for Solar Energy Systems VI, 989812 (29 April 2016); doi: 10.1117/12.2227944
Published in SPIE Proceedings Vol. 9898:
Photonics for Solar Energy Systems VI
Ralf B. Wehrspohn; Andreas Gombert, Editor(s)
PDF: 10 pages
Proc. SPIE 9898, Photonics for Solar Energy Systems VI, 989812 (29 April 2016); doi: 10.1117/12.2227944
Show Author Affiliations
P. Cebrian-Xochihuila, Univ. Nacional Autónoma de México (Mexico)
O. Huerta-Carranza, Univ. Nacional Autónoma de México (Mexico)
O. Huerta-Carranza, Univ. Nacional Autónoma de México (Mexico)
R. Díaz-Uribe, Univ. Nacional Autónoma de México (Mexico)
Published in SPIE Proceedings Vol. 9898:
Photonics for Solar Energy Systems VI
Ralf B. Wehrspohn; Andreas Gombert, Editor(s)
© SPIE. Terms of Use
