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Proceedings Paper

Dielectric response of pure and doped-GaSe crystals studied by an indigenously developed broadband THz-TDS system
Author(s): Amit C. Das; S. Bhattacharya; K. C. Mandal; S. Mondal; M. Jewariya; T. Ozaki; S. N. B. Bhaktha; P. K. Datta
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Paper Abstract

Publisher’s Note: This paper, originally published on 12 July 2016, was replaced with a corrected/revised version on 26 July 2016. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance. We have developed a terahertz time domain spectroscopy system (THz TDS). For THz generation, optical rectification process and for detection, electro-optic sampling processes are used. Identical < 110 > cut ZnTe crystals are used for both generation and detection of THz radiation.This spectroscopy system can be used for the noninvasive and contactless electrical and optical characterizations of various samples. In this work spectroscopic measurements of pure, Chromium and Indium doped GaSe crystals within 0.4 THz to 3 THz range are taken by the developed set-up to study the dielectric response of the samples.

Paper Details

Date Published: 12 July 2016
PDF: 6 pages
Proc. SPIE 9894, Nonlinear Optics and its Applications IV, 98941E (12 July 2016); doi: 10.1117/12.2227357
Show Author Affiliations
Amit C. Das, Indian Institute of Technology Kharagpur (India)
S. Bhattacharya, Indian Institute of Technology Kharagpur (India)
K. C. Mandal, Univ. of South Carolina (United States)
S. Mondal, Institute of Photonics and Electronics (Czech Republic)
M. Jewariya, National Physical Lab. (India)
T. Ozaki, INRS, Univ. du Québec (Canada)
S. N. B. Bhaktha, Indian Institute of Technology Kharagpur (India)
P. K. Datta, Indian Institute of Technology Kharagpur (India)

Published in SPIE Proceedings Vol. 9894:
Nonlinear Optics and its Applications IV
Benjamin J. Eggleton; Neil G. R. Broderick; Alexander L. Gaeta, Editor(s)

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