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Proceedings Paper

ISO 10360 verification tests applied to CMMs equipped with a laser line scanner
Author(s): B. Boeckmans; G. Probst; M. Zhang; W. Dewulf; J.-P. Kruth
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Paper Abstract

Within the field of quality control and dimensional metrology, the evolutions in the domain of production processes are triggering more use of non-contact measurement equipment to assure faster feature assessment where possible. This led to the development of for instance laser line scanners. The standardization of these new tools follows these novel evolutions. As the coordinate measuring systems (CMSs) which include coordinate measuring machines (CMMs) with its diversity in measurement probes widens its spectrum, the ISO 10360 standard series is rearranged and split up in more parts, covering specific probe groups. The previously mentioned laser line scanners, that can be equipped on a CMM, are integrated within ISO 10360-8 which applies for CMMs equipped with optical distance sensors. This paper is an example of how to interpret and apply this standard to a specific optical distance sensor. This has to be done by taking into account the sensor’s characteristics. The intrinsic properties in the technique require an in-depth look at the recommended guidelines within the standard. Furthermore, the guidelines are adapted to use the same capabilities of the laser line scanner, which are used for measuring, without eliminating the uncertainties present in practical use of the sensor. The verification tests and their implementation are discussed, adapted to the sensors needs and performed on a state-of-the-art CMM. The verification parameter results are determined, presented and critically evaluated.

Paper Details

Date Published: 19 May 2016
PDF: 10 pages
Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 986805 (19 May 2016); doi: 10.1117/12.2227061
Show Author Affiliations
B. Boeckmans, KU Leuven (Belgium)
G. Probst, KU Leuven (Belgium)
M. Zhang, KU Leuven (Belgium)
Beijing Univ. of Technology (China)
W. Dewulf, KU Leuven (Belgium)
J.-P. Kruth, KU Leuven (Belgium)

Published in SPIE Proceedings Vol. 9868:
Dimensional Optical Metrology and Inspection for Practical Applications V
Kevin G. Harding; Song Zhang, Editor(s)

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