Share Email Print

Proceedings Paper

Design the algorithm compensation of vignetting error at optical-electronic autoreflection system by modelling vignetted image
Author(s): Igor A. Konyakhin; Aiganym M. Sakhariyanova; Renpu Li
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Nowadays one of metrology problems is the measurement of angular values, in particular, angular deformations in the critical points of oversized objects. For the solution of this problem, effectively use optoelectronic autoreflection systems. The autoreflection systems allows measuring a mirror turning angle as sensitive element in a point of angular deformation with a potential accuracy up to 0.05". Actually the error can exceed considerably the specified value because of existence of systematic error, one of which main components is the error flowing to vignetting of a working beam. The component of systematic error due to vignetting of the beam can be eliminated in case of existence of the analytical description of changes in irradiance distribution of the analyzed image. Because of the complexity of the analytical description of the vignetting processes proposes the use of computer models. Based on the received dependence for compensation of systematic error due to vignetting is equal D=30 arcsecs. As this systematic measurement error unacceptably large, there is a need to compensate for this error. For the design of the algorithm compensate for systematic error were considered three cases of displacement vignetting field on a matrix analyzer due to the rotation of control element. Using the compensation algorithm, the error due to the vignetting amounts to a negligible value 0.4 arcsecs. The designed algorithm compensation systematic error due to vignetting allows to increase the working distance at the autoreflection measurements.

Paper Details

Date Published: 27 April 2016
PDF: 7 pages
Proc. SPIE 9889, Optical Modelling and Design IV, 988915 (27 April 2016); doi: 10.1117/12.2225883
Show Author Affiliations
Igor A. Konyakhin, ITMO Univ. (Russian Federation)
Aiganym M. Sakhariyanova, ITMO Univ. (Russian Federation)
Renpu Li, ITMO Univ. (Russian Federation)

Published in SPIE Proceedings Vol. 9889:
Optical Modelling and Design IV
Frank Wyrowski; John T. Sheridan; Youri Meuret, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?