
Proceedings Paper
Automated and semi-automated field testing of night vision gogglesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
This paper will discuss the development and results of a new field portable test set for Gen 2 and Gen 3 night vision
goggles that automates many of the tests supported by currently available NVG test products. The major innovation is
the use of MTF testing with a knife edge target. MTF testing is established in the laboratory environment and well suited
to replace the operator's interpretation of the USAF 1951 resolution chart. Results will be presented to show the more
consistent performance of the MTF approach as compared to the known operator variations when humans determine
resolution. Other standard tests are semi-automated and/or video-assisted, such as infinity focus, spot defects, and
distortion. The presentation will show repeatability across test units and operators on the key tests. The presentation will
include automatically generated examples of the report files for each test run on each goggle. All of these capabilities are
provided in a package that matches the form factor of other products in use to test NVG’s. A discussion of the user
interface and the ease of use of the system will be included as well as the improvement in the test time for each goggle
type.
Paper Details
Date Published: 3 May 2016
PDF: 11 pages
Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 982010 (3 May 2016); doi: 10.1117/12.2225088
Published in SPIE Proceedings Vol. 9820:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
Gerald C. Holst; Keith A. Krapels, Editor(s)
PDF: 11 pages
Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 982010 (3 May 2016); doi: 10.1117/12.2225088
Show Author Affiliations
Stephen Scopatz, Electro Optical Industries, LLC (United States)
Dominic Paszkeicz, Electro Optical Industries, LLC (United States)
Dominic Paszkeicz, Electro Optical Industries, LLC (United States)
Brent Langsdorf, Nightline, Inc. (United States)
Published in SPIE Proceedings Vol. 9820:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
Gerald C. Holst; Keith A. Krapels, Editor(s)
© SPIE. Terms of Use
