
Proceedings Paper
RICOR development of the next generation highly reliable rotary cryocoolerFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Early rotary cryocoolers were designed for the lifetime of a few thousands operating hours. Ricor K506 model’s life
expectancy was only 5,000 hours, then the next generation K508 model was designed to achieve 10,000 operating hours
in basic conditions, while the modern K508N was designed for 20,000 operating hours.
Nowadays, the new challenges in the field of rotary cryocoolers require development of a new generation cooler that
could compete with the linear cryocooler reliability, achieving the lifetime goal of 30,000 operating hours, and even
more.
Such new advanced cryocooler can be used for upgrade existing systems, or to serve the new generation of high-temperature
detectors that are currently under development, enabling the cryocooler to work more efficiently in the field.
The improvement of the rotary cryocooler reliability is based on a deep analysis and understating of the root failure
causes, finding solutions to reduce bearings wear, using modern materials and lubricants. All of those were taken into
consideration during the development of the new generation rotary coolers.
As a part of reliability challenges, new digital controller was also developed, which allows new options, such as discrete
control of the operating frequency, and can extend the cooler operating hours due to new controlling technique. In
addition, the digital controller will be able to collect data during cryocooler operation, aiming end of life prediction.
Paper Details
Date Published: 17 May 2016
PDF: 12 pages
Proc. SPIE 9821, Tri-Technology Device Refrigeration (TTDR), 982109 (17 May 2016); doi: 10.1117/12.2224457
Published in SPIE Proceedings Vol. 9821:
Tri-Technology Device Refrigeration (TTDR)
Richard I. Epstein; Bjørn F. Andresen; Markus P. Hehlen; Ingo N. Rühlich; Mansoor Sheik-Bahae; Thomas Fraser, Editor(s)
PDF: 12 pages
Proc. SPIE 9821, Tri-Technology Device Refrigeration (TTDR), 982109 (17 May 2016); doi: 10.1117/12.2224457
Show Author Affiliations
Itai Regev, RICOR Cryogenic and Vacuum Systems (Israel)
Ilan Nachman, RICOR Cryogenic and Vacuum Systems (Israel)
Dorit Livni, RICOR Cryogenic and Vacuum Systems (Israel)
Ilan Nachman, RICOR Cryogenic and Vacuum Systems (Israel)
Dorit Livni, RICOR Cryogenic and Vacuum Systems (Israel)
Sergey Riabzev, RICOR Cryogenic and Vacuum Systems (Israel)
Avishai Filis, RICOR Cryogenic and Vacuum Systems (Israel)
Victor Segal, RICOR Cryogenic and Vacuum Systems (Israel)
Avishai Filis, RICOR Cryogenic and Vacuum Systems (Israel)
Victor Segal, RICOR Cryogenic and Vacuum Systems (Israel)
Published in SPIE Proceedings Vol. 9821:
Tri-Technology Device Refrigeration (TTDR)
Richard I. Epstein; Bjørn F. Andresen; Markus P. Hehlen; Ingo N. Rühlich; Mansoor Sheik-Bahae; Thomas Fraser, Editor(s)
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