
Proceedings Paper
State of the art of AIM LWIR and VLWIR MCT 2D focal plane detector arrays for higher operating temperaturesFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper AIM presents its latest results on both n-on-p and p-on-n low dark current planar MCT photodiode
technology LWIR and VLWIR two-dimensional focal plane detector arrays with a cut-off wavelength >11μm at 80K
and a 640x512 pixel format at a 20μm pitch. Thermal dark currents significantly reduced as compared to ‘Tennant’s
Rule 07’ at a yet good detection efficiency >60% as well as results from NETD and photo response performance
characterization are presented. The demonstrated detector performance paces the way for a new generation of higher
operating temperature LWIR MCT FPAs with a <30mK NETD up to a 110K detector operating temperature and with
good operability.
Paper Details
Date Published: 20 May 2016
PDF: 16 pages
Proc. SPIE 9819, Infrared Technology and Applications XLII, 98191C (20 May 2016); doi: 10.1117/12.2223001
Published in SPIE Proceedings Vol. 9819:
Infrared Technology and Applications XLII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)
PDF: 16 pages
Proc. SPIE 9819, Infrared Technology and Applications XLII, 98191C (20 May 2016); doi: 10.1117/12.2223001
Show Author Affiliations
H. Figgemeier, AIM INFRAROT-MODULE GmbH (Germany)
S. Hanna, AIM INFRAROT-MODULE GmbH (Germany)
D. Eich, AIM INFRAROT-MODULE GmbH (Germany)
K.-M. Mahlein, AIM INFRAROT-MODULE GmbH (Germany)
S. Hanna, AIM INFRAROT-MODULE GmbH (Germany)
D. Eich, AIM INFRAROT-MODULE GmbH (Germany)
K.-M. Mahlein, AIM INFRAROT-MODULE GmbH (Germany)
W. Fick, AIM INFRAROT-MODULE GmbH (Germany)
W. Schirmacher, AIM INFRAROT-MODULE GmbH (Germany)
R. Thöt, AIM INFRAROT-MODULE GmbH (Germany)
W. Schirmacher, AIM INFRAROT-MODULE GmbH (Germany)
R. Thöt, AIM INFRAROT-MODULE GmbH (Germany)
Published in SPIE Proceedings Vol. 9819:
Infrared Technology and Applications XLII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)
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