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Proceedings Paper

Phase and coherent scatter imaging for improved discrimination of low-density materials
Author(s): Jonathan C. Petruccelli; Danielle Hayden; Sean Starr-Baier; Sajjad Tahir; Mahboob Ur Rehman; Laila Hassan; C. A. MacDonald
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Paper Abstract

Phase contrast and coherent scatter imaging have the potential to improve the detection of materials of interest in x ray screening. While attenuation is dependent on atomic number, phase is highly dependent on electron density, and thus offers an additional discriminant. A major limitation of phase imaging has been the required spatial coherence of the xray illumination, which typically requires a small (10-50 μm) source or multiple images captured with precision gratings, both of which present challenges for high throughput image acquisition. An alternative approach uses a single coarse mesh. This significantly relaxes the source spot size requirement, improving acquisition times and allows near-real-time phase extraction using Fourier processing of the acquired images. Diffraction signatures provide a third approach which yields another set of information to identify materials. Specific angles characteristic of target materials are selected through broad slot apertures for rapid throughput. Depth information can be extracted from stereoscopic imaging using multiple slots. A system capable of simultaneous phase, coherent scatter, and absorption imaging was constructed. Discrimination of materials on the basis of both phase and coherent scatter signatures is demonstrated.

Paper Details

Date Published: 12 May 2016
PDF: 9 pages
Proc. SPIE 9847, Anomaly Detection and Imaging with X-Rays (ADIX), 98470C (12 May 2016); doi: 10.1117/12.2222937
Show Author Affiliations
Jonathan C. Petruccelli, Univ. at Albany (United States)
Danielle Hayden, Univ. at Albany (United States)
Sean Starr-Baier, Univ. at Albany (United States)
Sajjad Tahir, Univ. at Albany (United States)
Mahboob Ur Rehman, Univ. at Albany (United States)
Laila Hassan, Univ. at Albany (United States)
C. A. MacDonald, Univ. at Albany (United States)

Published in SPIE Proceedings Vol. 9847:
Anomaly Detection and Imaging with X-Rays (ADIX)
Amit Ashok; Mark A. Neifeld; Michael E. Gehm, Editor(s)

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