
Proceedings Paper
Fiber faceplate modulation readout in Bi-material micro-cantilever mirror array imaging systemFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Fiber faceplate modulation was applied to read out the precise actuation of silicon-based, surface micro-fabricated cantilever mirrors array in optical imaging system. The faceplate was made by ordered bundles consisting of as many as ten thousands fibers. The transmission loss of an individual fiber in the bundles was 0.35dB/cm and the cross talk between neighboring fibers in the faceplate was about 15%. Micro-cantilever mirrors array (Focal-Plane Array (FPA)) which composed of two-level bi-material pixels, absorb incident infrared flux and result in a temperature increase. The temperature distribution of incident flux transformed to the deformation distribution in FPA which has a very big difference in coefficients of thermal expansion. FPA plays the roles of target sensing and has the characteristics of high detection sensitivity. Instead of general filter such as knife edge or pinhole, fiber faceplate modulate the beam reflected by the units of FPA. An optical readout signal brings a visible spectrum into pattern recognition system, yielding a visible image on monitor. Thermal images at room temperature have been obtained. The proposed method permits optical axis compact and image noise suppression.
Paper Details
Date Published: 19 May 2016
PDF: 9 pages
Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680J (19 May 2016); doi: 10.1117/12.2222162
Published in SPIE Proceedings Vol. 9868:
Dimensional Optical Metrology and Inspection for Practical Applications V
Kevin G. Harding; Song Zhang, Editor(s)
PDF: 9 pages
Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680J (19 May 2016); doi: 10.1117/12.2222162
Show Author Affiliations
Mei Hui, Beijing Institute of Technology (China)
Zhengzheng Xia, Beijing Institute of Technology (China)
Ming Liu, Beijing Institute of Technology (China)
Zhengzheng Xia, Beijing Institute of Technology (China)
Ming Liu, Beijing Institute of Technology (China)
Liquan Dong, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 9868:
Dimensional Optical Metrology and Inspection for Practical Applications V
Kevin G. Harding; Song Zhang, Editor(s)
© SPIE. Terms of Use
