Share Email Print

Proceedings Paper

BESSY Bragg-Fresnel multilayer beam monitors
Author(s): Karsten Holldack; Alexei I. Erko; William B. Peatman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

X-ray optical systems based on Bragg-Fresnel multilayer components imaging an electron beam in a storage ring with micrometer resolution are presented. Design concepts are compared to alternative methods, and the aberrations and limits of Bragg-Fresnel multilayer optics are discussed. Experimental results of imaging the BESSY I source with sub 10 micrometer resolution are presented and the development of a compact Bragg-Fresnel multilayer telescope as a BESSY II standard beam monitor is described.

Paper Details

Date Published: 25 September 1995
PDF: 7 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221675
Show Author Affiliations
Karsten Holldack, BESSY GmbH (Germany)
Alexei I. Erko, BESSY GmbH (Germany)
William B. Peatman, BESSY GmbH (Germany)

Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)

© SPIE. Terms of Use
Back to Top