Proceedings Paper
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Paper Abstract
X-ray multilayer supermirrors for the energy range up to 22 KeV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bi-layers of different thicknesses on an Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 KeV to 22 KeV at a grazing incidence angle of 0.32 degrees.
Paper Details
Date Published: 25 September 1995
PDF: 4 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221674
Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)
PDF: 4 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221674
Show Author Affiliations
Alexei I. Erko, BESSY GmbH (Germany)
Franz Shaefers, BESSY GmbH (Germany)
Bernard Vidal, Univ. d'Aix-Marseille II (France)
Franz Shaefers, BESSY GmbH (Germany)
Bernard Vidal, Univ. d'Aix-Marseille II (France)
Andrey E. Yakshin, Univ. d'Aix-Marseille III (France) and Institute of Microelectronics Technology (Russia)
Pierre Chevallier, LURE (France)
Pierre Chevallier, LURE (France)
Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)
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