Proceedings Paper
Hard x-ray microanalytical beam line at the CAMD synchrotron| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Argonne National Laboratory (ANL) is collaborating with Louisiana State University (LSU) in constructing a synchrotron x-ray micro-analytical beamline at the Center for Advanced Microstructures and Devices (CAMD) in Baton Rouge, Louisiana. This project grew from earlier work at the National Synchrotron Light Source (NSLS), where a team of ANL researchers developed techniques to examine small-scale structures in diffusion zones of a variety of materials. The ANL/CAMD beamline will use x-ray fluorescence, diffraction, and absorption spectroscopy techniques to reveal both compositional and structural information on a microscopic scale.
Paper Details
Date Published: 25 September 1995
PDF: 5 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221672
Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)
PDF: 5 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221672
Show Author Affiliations
Mark C. Petri, Argonne National Lab. (United States)
Leonard Leibowitz, Argonne National Lab. (United States)
Leonard Leibowitz, Argonne National Lab. (United States)
Paul Schilling, Louisiana State Univ. (United States)
Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)
© SPIE. Terms of Use
