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Proceedings Paper

Development of XUV interferometry (155 A) using a soft x-ray laser
Author(s): Luiz Barroca Da Silva; Troy W. Barbee Jr.; Robert C. Cauble; Peter M. Celliers; Dino R. Ciarlo; Stephen B. Libby; Richard A. London; Dennis L. Matthews; Stanley Mrowka; Juan C. Moreno; James E. Trebes; Alan S. Wan; Franz A. Weber
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Paper Abstract

Over the past several years we have developed a variety of techniques for probing plasmas with x-ray lasers. These have included direct high resolution plasma imaging to quantify laser produced plasma uniformities and moire deflectometry to measure electron density profiles in one-dimension. Although these techniques have been valuable a need existed for direct two dimensional measurements of electron densities in large high density plasmas. For this reason we have worked on developing an xuv interferometer compatible with the harsh environment of laser produced plasmas. This paper describes our design and presents some results showing excellent fringe visibility using the neon-like yttrium x-ray laser operating at 155 angstrom. The coherence properties of this x-ray laser source were measured using interferometry and are also discussed.

Paper Details

Date Published: 25 September 1995
PDF: 9 pages
Proc. SPIE 2520, Soft X-Ray Lasers and Applications, (25 September 1995); doi: 10.1117/12.221644
Show Author Affiliations
Luiz Barroca Da Silva, Lawrence Livermore National Lab. (United States)
Troy W. Barbee Jr., Lawrence Livermore National Lab. (United States)
Robert C. Cauble, Lawrence Livermore National Lab. (United States)
Peter M. Celliers, Lawrence Livermore National Lab. (United States)
Dino R. Ciarlo, Lawrence Livermore National Lab. (United States)
Stephen B. Libby, Lawrence Livermore National Lab. (United States)
Richard A. London, Lawrence Livermore National Lab. (United States)
Dennis L. Matthews, Lawrence Livermore National Lab. (United States)
Stanley Mrowka, Lawrence Livermore National Lab. (United States)
Juan C. Moreno, Lawrence Livermore National Lab. (United States)
James E. Trebes, Lawrence Livermore National Lab. (United States)
Alan S. Wan, Lawrence Livermore National Lab. (United States)
Franz A. Weber, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 2520:
Soft X-Ray Lasers and Applications
Jorge J. G. Rocca; Peter L. Hagelstein, Editor(s)

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