
Proceedings Paper
Evaluation of PDA measuring results obtained from sprays of optically inhomogeneous liquidsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
For control and optimization of atomization processes measurement techniques are employed being able to determine the diameter and the velocity of the generated droplets. The so-called 'Phase-Doppler- Anemometry' (PDA) measuring simultaneously both distributions has been successfully applied to sprays of homogeneous liquids like water, molten metals etc. In a lot of other technical processed liquids contain optical inhomogeneities consisting of suspended superfine particles. In general the measured droplet size distributions of such process fluids appear to be broadened compared to the 'real-one'. In the following an approximate method for finding the 'real-size' distributions is introduced. A blurring function is obtained by performing PDA measurements on single-sized droplets. An interative constrained inversion algorithm is applied evaluating the real-size distribution. The precision of the algorithm is checked by comparing the calculated distributions with undistorted measuring results of an atomized optically homogeneous liquid.
Paper Details
Date Published: 29 September 1995
PDF: 9 pages
Proc. SPIE 2546, Optical Techniques in Fluid, Thermal, and Combustion Flow, (29 September 1995); doi: 10.1117/12.221548
Published in SPIE Proceedings Vol. 2546:
Optical Techniques in Fluid, Thermal, and Combustion Flow
Soyoung Stephen Cha; James D. Trolinger, Editor(s)
PDF: 9 pages
Proc. SPIE 2546, Optical Techniques in Fluid, Thermal, and Combustion Flow, (29 September 1995); doi: 10.1117/12.221548
Show Author Affiliations
Thomas Wriedt, Institut fuer Werkstofftechnik (Germany)
Mario Mitschke, Univ. Bremen (Germany)
Mario Mitschke, Univ. Bremen (Germany)
Peter Lehmann, Univ. Bremen (Germany)
Published in SPIE Proceedings Vol. 2546:
Optical Techniques in Fluid, Thermal, and Combustion Flow
Soyoung Stephen Cha; James D. Trolinger, Editor(s)
© SPIE. Terms of Use
