Share Email Print

Proceedings Paper

700 kHz beam scanning using electro-optic KTN planar optical deflector
Author(s): Shoko Tatsumi; Yuzo Sasaki; Seiji Toyoda; Tadayuki Imai; Junya Kobayashi; Tadashi Sakamoto
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

For high-speed optical beam scanning, we developed a novel planar optical deflector using KTa1-xNbxO3 (KTN) crystals. When a KTN deflector is operated at high frequencies, heat generated by KTN causes a decrease in its relative dielectric constant, which limits the deflection angle at frequencies above 200 kHz. To overcome this problem, we decreased the thickness of KTN to reduce its capacitance because the heat it generates is proportional to its capacitance. We arranged the two electrodes on the same surface, whereas previously reported structures have each electrode on opposite surfaces. We successfully reduced KTN’s capacitance to 1/30 of that previously reported. The deflection angle of this novel structure at 700 kHz is 16.89 mrad, which is more than half of that at 100 kHz, while the deflection angle of previously reported thick KTN rapidly decreases at more than 200 kHz. The experimental results indicate that our proposed planar optical deflector is effective for suppressing heat generation in KTN and improving the scanning speed of deflectors.

Paper Details

Date Published: 24 February 2016
PDF: 6 pages
Proc. SPIE 9744, Optical Components and Materials XIII, 97440L (24 February 2016); doi: 10.1117/12.2210803
Show Author Affiliations
Shoko Tatsumi, Nippon Telegraph and Telephone Corp. (Japan)
Yuzo Sasaki, Nippon Telegraph and Telephone Corp. (Japan)
Seiji Toyoda, Nippon Telegraph and Telephone Corp. (Japan)
Tadayuki Imai, Nippon Telegraph and Telephone Corp. (Japan)
Junya Kobayashi, Nippon Telegraph and Telephone Corp. (Japan)
Tadashi Sakamoto, Nippon Telegraph and Telephone Corp. (Japan)

Published in SPIE Proceedings Vol. 9744:
Optical Components and Materials XIII
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?