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Proceedings Paper

Birefringence measurement of glass ion-exchanged waveguides: burying depth or cover layer influence
Author(s): D. Jamon; J. P. Garayt; E. Jordan; F. Parsy; E. Ghibaudo; S. Neveu; J.-E. Broquin; F. Royer
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Paper Abstract

This paper deals with an experimental non-destructive technique for the measurement of polarization behavior of integrated optical waveguides. It is based on a high resolution polarimeter associated to an ellipsometric-type calibration which allows determining the full state of polarization of the output light. A magneto-optic perturbation is also added to generate TE/TM mode beating, whose spatial period is directly linked to the modal TE/TM birefringence. This equipment is first qualified by the measurement of modal birefringence in totally or partially buried ion exchanged waveguides. The results show that the value of the birefringence varies as a function of the diffusion aperture width or with the burying depth. By adding a magneto-optical cover layer, consisting in magnetic nanoparticles doped silica matrix obtained by a sol gel process 1, we evidence a huge increase of the beating magnitude and a decrease of the modal birefringence.

Paper Details

Date Published: 1 March 2016
PDF: 8 pages
Proc. SPIE 9750, Integrated Optics: Devices, Materials, and Technologies XX, 97500B (1 March 2016); doi: 10.1117/12.2209273
Show Author Affiliations
D. Jamon, Lab. Hubert Curien, CNRS (France)
J. P. Garayt, Lab. Hubert Curien, CNRS (France)
E. Jordan, IMEP-LAHC (France)
F. Parsy, IMEP-LAHC (France)
E. Ghibaudo, IMEP-LAHC (France)
S. Neveu, Lab. PHENIX, CNRS (France)
J.-E. Broquin, IMEP-LAHC (France)
F. Royer, Lab. Hubert Curien, CNRS (France)

Published in SPIE Proceedings Vol. 9750:
Integrated Optics: Devices, Materials, and Technologies XX
Jean-Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)

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