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Proceedings Paper

Ellipsometry with far-infrared lasers
Author(s): Karl Barth; Fritz Keilmann
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Paper Abstract

A rotating analyzer ellipsometer for the far-infrared wavelength range from 30 to 1200 microns has been developed. The instrument uses well-collimated radiation from a step-tunable CW gas laser source. Wire-grid polarizers are employed which give a polarization purity of 10,000:1. To test the instrument, the birefringence of crystal quartz was measured in transmission. Applications are in the characterization of semiconductors and of high-Tc superconductors.

Paper Details

Date Published: 1 October 1990
PDF: 5 pages
Proc. SPIE 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, (1 October 1990); doi: 10.1117/12.22076
Show Author Affiliations
Karl Barth, Max-Planck-Institut für Festkörperforschung (Germany)
Fritz Keilmann, Max-Planck-Institut fuer Festkoerperforschung (Germany)

Published in SPIE Proceedings Vol. 1317:
Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray
Russell A. Chipman; John W. Morris, Editor(s)

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