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Proceedings Paper

A fake defect phenomenon in defect detection of thermographic NDT: a three-dimensional numerical analysis
Author(s): Chunli Fan; Hailiang Wang; Lin Zhang; Li Yang; Fengrui Sun
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Paper Abstract

As we all know, the temperature distributions reflected in the thermal images are the basis for detecting the information of subsurface defect in thermographic NDT. In the actual work of thermographic nondestructive inspection of the inner surface geometry of a plate-shaped structure, the cave defect in the inner heated surface usually results in a temperature rise of the outer inspection surface. However, on some specific conditions, an extension on the inner surface will also result in the same temperature rise of the inspection surface. Because the extension has no negative effect on the reliability of the plate or this extension is an originally designed functional structure, we may call this extension of the inner surface “fake defect”. In this paper, we will take a three-dimensional plate with a cylindrical extension as an example to discuss how this fake-defect phenomenon forms and when this phenomenon appears. This study is of meaning to both the inspection and quantitative identification of the inner-surface defect based on infrared thermographic temperature measurements of the outer plate surface.

Paper Details

Date Published: 15 October 2015
PDF: 9 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 967435 (15 October 2015); doi: 10.1117/12.2205257
Show Author Affiliations
Chunli Fan, Naval Univ. of Engineering (China)
Hailiang Wang, Naval Univ. of Engineering (China)
Lin Zhang, Naval Univ. of Engineering (China)
Li Yang, Naval Univ. of Engineering (China)
Fengrui Sun, Naval Univ. of Engineering (China)

Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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