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Proceedings Paper

Test system for phase-change optical disks
Author(s): Shuji Urabe; Akira Ohya; Kenta Mikuriya; Masato Yamomoto
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Paper Abstract

We have developed a test system for phase-change optical disks. The test system has a two-beam head, which can vary the distance between the two laser spots from -0.3 to 2.8 μm. Erasing characteristics can be evaluated by changing the intensity profile of the erasing spot composed of two laser spots. Focusing the two spots on the same position allows high laser power writing up to 27mW. Reflectance change after the irradiation by one spot can be observed by another spot on rotating disks. This test system can evaluate the single beam overwriting characteristics.

Paper Details

Date Published: 1 August 1990
PDF: 5 pages
Proc. SPIE 1316, Optical Data Storage, (1 August 1990); doi: 10.1117/12.22037
Show Author Affiliations
Shuji Urabe, Yokogawa Electric Corp. (Japan)
Akira Ohya, Yokogawa Electric Corp. (Japan)
Kenta Mikuriya, Yokogawa Electric Corp. (Japan)
Masato Yamomoto, Yokogawa Electric Corp. (Japan)

Published in SPIE Proceedings Vol. 1316:
Optical Data Storage
Maarten de Haan; Yoshito Tsunoda, Editor(s)

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