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Proceedings Paper

Application of Terahertz Time-Domain Spectroscopy in nondestructive testing of adhesion quality
Author(s): Duo Zhao; Jiaojiao Ren; Xiaoli Qao; Lijuan Li
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Paper Abstract

Multilayer composites assembled flexibly with have important effect on the performance and safety of aircrafts. The nondestructive detection on the adhesion layer is an important index to evaluate the quality of aircraft assembly. Terahertz Time-Domain Spectroscopy (THz-TDS) is a newly developed spectroscopy technique based on femtosecond laser technology which currently applied to qualitative analysis as a means of security detection and material identification. Compared with the traditional tensile testing, the detection of defects in the adhesion layer could be nondestructive, visible, positioning and more accurate. The spectral analysis on the material to be assembled was done respectively. The testing model was established in accord with the extracted optical parameters. With the employment of a reflective THz-TDS device, X-Y spot scanning was done to obtain waveforms of every location on an assembled sample. Layered analysis was done by selecting region of interest in time domain waveforms. Conclusions of Time- Frequency spectrum analysis and scanning imaging performance are relatively satisfying through the experiments. The defects could be located and analyzed accurately and efficiently. The research reveals that THz-TDS (0.1THz~5THz) has good testing performance on the adhesion quality of multilayer composites.

Paper Details

Date Published: 15 October 2015
PDF: 7 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96741P (15 October 2015); doi: 10.1117/12.2199643
Show Author Affiliations
Duo Zhao, Changchun Univ. of Science and Technology (China)
Jiaojiao Ren, Changchun Univ. of Science and Technology (China)
Xiaoli Qao, Changchun Univ. of Science and Technology (China)
Lijuan Li, Changchun Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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