Share Email Print

Proceedings Paper

Analysis and judgment of key issues in data process for optical tracking and measurement
Author(s): Shuhua Cui; Si Shen; Yuanyuan Kang; Shaolin Hu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Regarding the application value of optically tracked and controlled data in unspecified arc segment, the means from random error characteristic, comparison of nominal parameters, influence of error propagation to measurement and control station distribution analysis have been presented to carry out comprehensive analysis of the measured data in an all-around way to understand the availability of optically tracked data unspecified by practical verification and application in engineering, which is used as an effective evidence for external ballistic data process and make ballistic parameter more precise and reliable as a result of redundant data.

Paper Details

Date Published: 15 October 2015
PDF: 5 pages
Proc. SPIE 9676, AOPC 2015: Optical Design and Manufacturing Technologies, 96760R (15 October 2015); doi: 10.1117/12.2199471
Show Author Affiliations
Shuhua Cui, State Key Lab. of Astronautic Dynamics (China)
Xi’an Satellite Control Ctr. of China (China)
Si Shen, Xi'an Satellite Control Ctr. of China (China)
Yuanyuan Kang, Xi'an Satellite Control Ctr. of China (China)
Shaolin Hu, Xi'an Satellite Control Ctr. of China (China)

Published in SPIE Proceedings Vol. 9676:
AOPC 2015: Optical Design and Manufacturing Technologies
Lin Li; Kevin P. Thompson; Ligong Zheng, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?