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Proceedings Paper

A novel scanning system using an industrial robot and the workspace measurement and positioning system
Author(s): Ziyue Zhao; Jigui Zhu; Linghui Yang; Jiarui Lin
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Paper Abstract

The present scanning system consists of an industrial robot and a line-structured laser sensor which uses the industrial robot as a position instrument to guarantee the accuracy. However, the absolute accuracy of an industrial robot is relatively poor compared with the good repeatability in the manufacturing industry. This paper proposes a novel method using the workspace measurement and positioning system (wMPS) to remedy the lack of accuracy of the industrial robot. In order to guarantee the positioning accuracy of the system, the wMPS which is a laser-based measurement technology designed for large-volume metrology applications is brought in. Benefitting from the wMPS, this system can measure different cell-areas by the line-structured laser sensor and fuse the measurement data of different cell-areas by using the wMPS accurately. The system calibration which is the procedure to acquire and optimize the structure parameters of the scanning system is also stated in detail in this paper. In order to verify the feasibility of the system for scanning the large free-form surface, an experiment is designed to scan the internal surface of the door of a car-body in white. The final results show that the measurement data of the whole measuring areas have been jointed perfectly and there is no mismatch in the figure especially in the hole measuring areas. This experiment has verified the rationality of the system scheme, the correctness and effectiveness of the relevant methods.

Paper Details

Date Published: 8 October 2015
PDF: 7 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770Y (8 October 2015); doi: 10.1117/12.2199311
Show Author Affiliations
Ziyue Zhao, Tianjin Univ. (China)
Jigui Zhu, Tianjin Univ. (China)
Linghui Yang, Tianjin Univ. (China)
Jiarui Lin, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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