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Proceedings Paper

The design of high dynamic range ROIC for IRFPAs
Author(s): Dazhao Jiang; Qinghua Liang; Qiwen Zhang; Honglei Chen; Ruijun Ding
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Paper Abstract

The charge packet readout integrated circuit (ROIC) technology for the IRFPAs is introduced, which can realize that every pixel achieves a very high capacity of the electrons storage, and it also improves the performance of the SNR and reduces the saturation possibility of the pixels. The ROIC for the LWIR requires ability that obtaining high capacity for storing electrons. For the conventional ROIC, the maximum charge capacity is determined by the integration capacitance and the operating voltage, it can achieve a high charge capacity through increasing the area of the integration capacitor or raising the operating voltage. And this paper would introduce a digital method of ROIC that can achieve a very high charge capacity. The circuit architecture of this approach includes the following parts, a preamplifier, a comparator, a counter, and memory arrays. And the maximum charge capacity of the pixel is determined by the counter bits. This new method can achieve a high charge capacity more than 1Ge- every pixel and output the digital signal directly, while that of conventional ROIC is less than 50Me- and output the analog signal from the pixel. In this new circuit, the comparator is a important module, as the integration voltage value need compare with threshold voltage through the comparator all the time during the integration period, and we will discuss the influence of the comparator. This work design the circuit with the CSMC 0.35um CMOS technology, and the simulation use the spectre model.

Paper Details

Date Published: 15 October 2015
PDF: 7 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740P (15 October 2015); doi: 10.1117/12.2197685
Show Author Affiliations
Dazhao Jiang, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Qinghua Liang, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Qiwen Zhang, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Honglei Chen, Shanghai Institute of Technical Physics (China)
Ruijun Ding, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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