
Proceedings Paper
Virtual Hartmann-shack image applied in laser beam wavefront correction and numerical simulation methodFormat | Member Price | Non-Member Price |
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Paper Abstract
In adaptive optics,Hartmann-shack wavefront sensor and image acquired from camera has been widely used to detect incident wavefront and the application of laser wavefront correction. A numerical simulation method of generating high resolution virtual camera image, which is based on Fourier optics and realized by FFT algorithm, is mentioned in this paper. In the condition of incident laser beam wavefront with only tilt phase aberration, calculating deviation of centroid offset between the result from virtual camera image and theoretical value, is compared to verify the accuracy of this numerical simulation method and virtual Hartmann-shack image generation model.
Paper Details
Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740N (15 October 2015); doi: 10.1117/12.2197607
Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)
PDF: 6 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740N (15 October 2015); doi: 10.1117/12.2197607
Show Author Affiliations
Yanchao Zhou, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Science (China)
Bing Xu, Institute of Optics and Electronics (China)
Shanqiu Chen, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Science (China)
Bing Xu, Institute of Optics and Electronics (China)
Shanqiu Chen, Institute of Optics and Electronics (China)
Wenjin Liu, Institute of Optics and Electronics (China)
Shuai Wang, Institute of Optics and Electronics (China)
Shuai Wang, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)
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