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Proceedings Paper

Speckle-based wavemeter
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Paper Abstract

A spectrometer based on the application of dynamic speckles will be disclosed. The method relies on scattering of primarily coherent radiation from a slanted rough surface. The scattered radiation is collected on a detector array and the speckle displacement is monitored during a change in the incident wavelength. The change of wavelength gives an almost linear phaseshift across the scattering surface resulting in an almost linear shift of the speckle pattern, which is subsequently monitored. It is argued that frequency changes close to 100 MHz can be probed using a common CMOS array. Experiments showing agreement with theoretical predictions will be given. An extension of the method, with which fast wavelength changes in the GHz regime can be probed, will be discussed but not experimentally verified. This method relies on shearing the dynamic speckle pattern across a cylindrical lens array as it’s well-known within spatial filtering velocimetry.

Paper Details

Date Published: 24 August 2015
PDF: 8 pages
Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 96600U (24 August 2015); doi: 10.1117/12.2195629
Show Author Affiliations
Steen G. Hanson, DTU Fotonik (Denmark)
Michael Linde Jakobsen, DTU Fotonik (Denmark)
Maumita Chakrabarti, DTU Fotonik (Denmark)

Published in SPIE Proceedings Vol. 9660:
SPECKLE 2015: VI International Conference on Speckle Metrology
Fernando Mendoza Santoyo; Eugenio R. Mendez, Editor(s)

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