Proceedings Paper
Comparative study of the laser damage threshold and optical characteristics of Ta2O5-SiO2 multilayers deposited using various methods| Format | Member Price | Non-Member Price |
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Paper Abstract
Manufacturing processes from the private and academic sectors were used to deposit anti-reflective and high-reflective coatings composed of Ta2O5 - SiO2 multilayers. Used deposition techniques included three Ion Assisted Deposition (IAD) systems and an Ion Beam Sputtering (IBS) system. Coatings were performed on fused silica (Corning 7980) substrates polished by two different suppliers. LIDT Measurements were performed using a Q-Switched Nd:YAG laser operating at 1064nm. The paper presents a comparison of the coatings in terms of laser damage threshold values, optical properties and surface quality.
Paper Details
Date Published: 23 November 2015
PDF: 9 pages
Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 963203 (23 November 2015); doi: 10.1117/12.2194084
Published in SPIE Proceedings Vol. 9632:
Laser-Induced Damage in Optical Materials: 2015
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)
PDF: 9 pages
Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 963203 (23 November 2015); doi: 10.1117/12.2194084
Show Author Affiliations
Roelene Botha, Rhysearch (Switzerland)
NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Silvia Schwyn Thöny, Evatec Ltd. (Switzerland)
Martin Grössl, FISBA AG (Switzerland)
Safer Mourad, FISBA AG (Switzerland)
Clau Maissen, SwissOptic AG (Switzerland)
Jacobus I. Venter, SwissOptic AG (Switzerland)
Thomas Südmeyer, Univ. of Neuchâtel (Switzerland)
NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Silvia Schwyn Thöny, Evatec Ltd. (Switzerland)
Martin Grössl, FISBA AG (Switzerland)
Safer Mourad, FISBA AG (Switzerland)
Clau Maissen, SwissOptic AG (Switzerland)
Jacobus I. Venter, SwissOptic AG (Switzerland)
Thomas Südmeyer, Univ. of Neuchâtel (Switzerland)
Martin Hoffmann, Univ. of Neuchâtel (Switzerland)
Pavel V. Bulkin, LPICM, Ecole Polytechnique (France)
Sabine Linz-Dittrich, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
David Bischof, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Markus Michler, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Stefan J. Rinner, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Andreas Ettemeyer, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Pavel V. Bulkin, LPICM, Ecole Polytechnique (France)
Sabine Linz-Dittrich, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
David Bischof, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Markus Michler, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Stefan J. Rinner, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Andreas Ettemeyer, NTB Interstate Univ. of Applied Sciences of Technology (Switzerland)
Published in SPIE Proceedings Vol. 9632:
Laser-Induced Damage in Optical Materials: 2015
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)
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