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Proceedings Paper

Imaging performance of microsphere plates
Author(s): Jonathan S. Lapington; Liam B. C. Worth; Matthew W. Trow
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Paper Abstract

The microsphere plate (MSP) is a new type of electron multiplier device operating along similar lines to the well known microchannel plate (MCP). The MSP is manufactured by El- Mul Technologies Ltd., using glass beads 20 to 60 micrometer diameter, sintered together to form a wafer less than 1 mm thick. Conductive coatings are applied to the upper and lower surfaces, and a high voltage is applied between these two electrodes, allowing secondary electron multiplication to take place. The device uses the surfaces of the randomly arranged interstices of the sintered glass beads as dynodes, whereas in the MCP, dynodes are constituted by the inner surfaces of the longitudinal pores. The homogeneous composition of the MSP causes charge to spread laterally during multiplication, resulting in a spatial resolution of about 2 linepairs/mm when proximity focused to a phosphor. Charge division readouts benefit from this charge spreading, such as the wedge and strip anode which requires a charge footprint of order 1 - 2 mm diameter. We present results of experiments on the imaging performance of detectors using MSPs with readouts such as the wedge and strip anode. We discuss and quantify the potential advantages to be gained from MSPs, such as the higher gain achievable per stage, reduced susceptibility to paralysis owing to their isotropic conductivity, etc. Potential MSP disadvantages, such as image nonlinearities, quantum efficiency variability, and pulse height saturation are analyzed.

Paper Details

Date Published: 1 September 1995
PDF: 8 pages
Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); doi: 10.1117/12.219375
Show Author Affiliations
Jonathan S. Lapington, Univ. College London (United Kingdom)
Liam B. C. Worth, Univ. College London (United Kingdom)
Matthew W. Trow, Univ. College London (United Kingdom)

Published in SPIE Proceedings Vol. 2518:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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