
Proceedings Paper
Field calibration of binocular stereo vision based on fast reconstruction of 3D control fieldFormat | Member Price | Non-Member Price |
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Paper Abstract
Construction of high-speed railway in China has entered a period of rapid growth. To accurately and quickly obtain the dynamic envelope curve of high-speed vehicle is an important guarantee for safe driving. The measuring system is based on binocular stereo vision. Considering the difficulties in field calibration such as environmental changes and time limits, carried out a field calibration method based on fast reconstruction of three-dimensional control field. With the rapid assembly of pre-calibrated three-dimensional control field, whose coordinate accuracy is guaranteed by manufacture accuracy and calibrated by V-STARS, two cameras take a quick shot of it at the same time. The field calibration parameters are then solved by the method combining linear solution with nonlinear optimization. Experimental results showed that the measurement accuracy can reach up to ± 0.5mm, and more importantly, in the premise of guaranteeing accuracy, the speed of the calibration and the portability of the devices have been improved considerably.
Paper Details
Date Published: 7 August 2015
PDF: 9 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230I (7 August 2015); doi: 10.1117/12.2193564
Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)
PDF: 9 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230I (7 August 2015); doi: 10.1117/12.2193564
Show Author Affiliations
Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)
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