
Proceedings Paper
Material property measurements with post-processed thermal image dataFormat | Member Price | Non-Member Price |
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Paper Abstract
Post-processing of infrared thermal image thta is a technique which finds many uses in a laboratory devoted to
non-destructhe evaluation (NDE) of materials. Among these are determination ofmaterial pmperty values and
detection/location of delaminations. Exanples are shown in which thermal diffusivity is measured for technique verification,
as a verification of the tensor nature of diffusivity measurements and as a proxy for porosity in a test sample of a material
under developmenL Another example is given in which the coefficient of thennal expansion is determined through the
phenomenon of thermoelasticity. A final example is given in which post-processing extrts the thermal signature of a
delamination from an image dominated by an unwanted feature. Following these examples of materials evaluation using
post-processing, a set of procedures common to the data analysis in the examples is extracted. Generic requirements are
given so that each procedure can operate consistently within the entire process to produce appropriate values of the material
characteristics sought.
Paper Details
Date Published: 1 March 1990
PDF: 10 pages
Proc. SPIE 1313, Thermosense XII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (1 March 1990); doi: 10.1117/12.21921
Published in SPIE Proceedings Vol. 1313:
Thermosense XII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Sharon A. Semanovich, Editor(s)
PDF: 10 pages
Proc. SPIE 1313, Thermosense XII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (1 March 1990); doi: 10.1117/12.21921
Show Author Affiliations
Christopher S. Welch, College of William and Mary (United States)
William P. Winfree, NASA/Langley Research Ctr. (United States)
D. Michele Heath, NASA/Langley Research Ctr. (United States)
William P. Winfree, NASA/Langley Research Ctr. (United States)
D. Michele Heath, NASA/Langley Research Ctr. (United States)
K. Elliott Cramer, NASA/Langley Research Ctr. (United States)
Patricia A. Howell, Analytical Services & Materials, Inc. (United States)
Patricia A. Howell, Analytical Services & Materials, Inc. (United States)
Published in SPIE Proceedings Vol. 1313:
Thermosense XII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Sharon A. Semanovich, Editor(s)
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