Share Email Print

Proceedings Paper

Fabrication and testing of STREEGO: a compact optical payload for earth observation on small satellites
Author(s): Massimiliano Rossi; Ivan Ferrario; Riccardo Ghislanzoni; Piet Holbrouck; Antonio Ritucci; Matteo Taccola; Marco Terraneo; Fabio E. Zocchi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the framework of an European Space Agency contract, Media Lario Technologies is developing an optical payload for Earth Observation targeted to small satellites. In this paper we present a detailed description of the imager which, by leveraging on aspheric surfaces, bonnet polishing, lightweight materials, an off-the-shelf large format CMOS detector and multispectral filters integrated in the FPA, achieves remarkable image quality with compact volume claim and mass of only 15 kg. The instrument is based on a three mirror anastigmat (TMA) design with an aperture of 200 mm and an F/number of 6. The payload is designed to provide a ground sampling distance (GSD) of 2.75 m for the panchromatic channel at a reference altitude of 600 km, a field of view of 1° and a nominal MTF greater than 60% at Nyquist frequency with a Signal to Noise Ratio (SNR) greater than 100.

Paper Details

Date Published: 24 September 2015
PDF: 9 pages
Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 962806 (24 September 2015); doi: 10.1117/12.2191285
Show Author Affiliations
Massimiliano Rossi, Media Lario Technologies S.r.l. (Italy)
Ivan Ferrario, Media Lario Technologies S.r.l. (Italy)
Riccardo Ghislanzoni, Media Lario Technologies S.r.l. (Italy)
Piet Holbrouck, Media Lario Technologies S.r.l. (Italy)
Antonio Ritucci, Media Lario Technologies S.r.l. (Italy)
Matteo Taccola, European Space Research and Technology Ctr. (Netherlands)
Marco Terraneo, Media Lario Technologies S.r.l. (Italy)
Fabio E. Zocchi, Media Lario Technologies S.r.l. (Italy)

Published in SPIE Proceedings Vol. 9628:
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Angela Duparré; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?