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Proceedings Paper

An automated calibration system that combines fringe projection and 2D digital image correlation
Author(s): Philip Siegmann; Luis A. Felipe-Sesé; Francisco Díaz Garrido ; José Piñeiro-Ave
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Paper Abstract

An optical non-contact and full-field system that allows large displacement measurements in x-, y- and z-direction is presented. The system combines 2-dimentional digital image correlation (for in-plane measurements) and fringe projection (for out-of-plane displacements) and uses only one camera. The in- and out-of-plane displacements are obtained at the same instant allowing real-time measurements thanks to a color encoding filtering procedure. The out-of-plane measurement allows the correction of the in-plane measurements and the system has to be precisely aligned by following an established alignment procedure. Furthermore, a calibration has to be done to obtain a fringe parameter k for each pixel of the specimen surface image necessary to relate the shifted phase with the out-of-plane displacements. The presented system obtains different values of k for each pixel because of the divergent and non-normal incidence of the fringe beam onto the sample surface (non zero incidence angle). The calibration is performed automatically and only has to be done once for each configuration of the system. The system is portable and can be easily adapted to measure large displacements and wide areas (using small incidence angle) or smaller distances but with higher resolutions (when increasing the incidence angle).

Paper Details

Date Published: 24 September 2015
PDF: 10 pages
Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 96281G (24 September 2015); doi: 10.1117/12.2191110
Show Author Affiliations
Philip Siegmann, Univ. de Alcalá (Spain)
Luis A. Felipe-Sesé, Univ. de Jaén (Spain)
Francisco Díaz Garrido , Univ. de Jaén (Spain)
José Piñeiro-Ave, Univ. de Alcalá (Spain)

Published in SPIE Proceedings Vol. 9628:
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Angela Duparré; Roland Geyl, Editor(s)

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