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Proceedings Paper

Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces
Author(s): Dong-Ik Kim; Ghiseok Kim; Geon Hee Kim
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Paper Abstract

In this paper, we propose an effective method for extracting the important parameters like radius of curvature, conic constant, and deformation coefficients indwelling unknown aspheric surfaces. These parameters can be inversely found from measured data by using the method that is based on aspheric equations and conic surfaces. To demonstrate the precision of the method, it is compared with a higher-order polynomial curve fit, employing two different examples. In a theoretical case, each largest fitting error (or shape error) resulted from the two methods appears a significant difference in precision. Lastly, we apply the proposed method to a real example and show the results.

Paper Details

Date Published: 24 September 2015
PDF: 8 pages
Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 962815 (24 September 2015); doi: 10.1117/12.2190503
Show Author Affiliations
Dong-Ik Kim, KAIST (Korea, Republic of)
Ghiseok Kim, Seoul National Univ. (Korea, Republic of)
Geon Hee Kim, Korea Basic Science Institute (Korea, Republic of)

Published in SPIE Proceedings Vol. 9628:
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Angela Duparré; Roland Geyl, Editor(s)

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