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Proceedings Paper

Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy
Author(s): Gary A. Valaskovic; Mark A. Holton; George H. Morrison
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Paper Abstract

Uncertainty in tip morphology of aluminum coated, fiber-optic near-field probes, and the large difference between the physical probe diameter and (smaller) optical diameter, lead to serious imaging artifacts in transmission mode near-field microscopy. Various dielectric materials of different topographies have been studied to develop an understanding of normal and anomalous contrast modes mainly characterized by topographically induced contrast.

Paper Details

Date Published: 6 September 1995
PDF: 4 pages
Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218695
Show Author Affiliations
Gary A. Valaskovic, Cornell Univ. (United States)
Mark A. Holton, Cornell Univ. (United States)
George H. Morrison, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 2535:
Near-Field Optics
Michael A. Paesler; Patrick J. Moyer, Editor(s)

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