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Proceedings Paper

CTE model for estimating CCD image smear
Author(s): James S. Flores
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Paper Abstract

Radiation promotes charge transfer inefficiency (CTI) in a CCD, causing focused images to become smeared. For example, such smearing will degrade the accuracy and precision of a CCD-based pointing system. A model has been created whereby CTI smearing caused by a radiation induced traps can be projected, given the spatial distribution and pixel position of the image, the large signal CTI, temperature, parallel and serial transfer frequencies. It is well known that CTI increases with signal size to some asymptotic level, and the model description offers a theory and function for this behavior. The final product indicates several complicating factors affecting CTI evaluation which could inflate results, and make precise comparisons between experiments.

Paper Details

Date Published: 8 September 1995
PDF: 10 pages
Proc. SPIE 2551, Photoelectronic Detectors, Cameras, and Systems, (8 September 1995); doi: 10.1117/12.218646
Show Author Affiliations
James S. Flores, Ball Aerospace Systems Group (United States)

Published in SPIE Proceedings Vol. 2551:
Photoelectronic Detectors, Cameras, and Systems
C. Bruce Johnson; Ervin J. Fenyves, Editor(s)

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