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Proceedings Paper

Thermal characterization of high strip current microchannel plate photomultipliers
Author(s): Andrea Sardella; Michele Bassan; Leonardo Giudicotti; Luca Lotto; Roberto Pasqualotto
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Paper Abstract

We have investigated the thermal behavior of a set of 40 mm, high strip current, microchannel plate (MCP) photomultipliers developed for a diagnostic system of a fusion plasma by laser scattering. These detectors include a V-stack of very low resistivity (5 X 106 (Omega) m) microchannel plates and must be operated with a pulsed high voltage power supply under strict control of the temperature. Therefore the resistance of the V-stacks has been studied as a function of the MCP temperature and of the applied voltage by applying short pulses of high voltage to the detectors in a temperature comtrolled environment. At low applied voltage (approximately 1 V) a resistance of 2.05 X 106 (Omega) was measured for one of the V-stacks, with a resistance coefficient of -1.47 X 104 (Omega) /degrees C. At high voltage the resistance was found to be lower by about a factor three and showed a linear decrease with both the MCP temperature and the applied high voltage. From these measurements the detector thermal capacitance and thermal conductivity were found to be 0.79 J/degrees C and 1.85 X W/degrees C respectively. The measured parameters are used in a simplified thermal model of the detectors for the construction of the pulsed power supply control system necessary to operate them in safe conditions.

Paper Details

Date Published: 8 September 1995
PDF: 8 pages
Proc. SPIE 2551, Photoelectronic Detectors, Cameras, and Systems, (8 September 1995); doi: 10.1117/12.218638
Show Author Affiliations
Andrea Sardella, EURATOM/ENEA/CNR/Univ. di Padova (Italy)
Michele Bassan, EURATOM/ENEA/CNR/Univ. di Padova (Italy)
Leonardo Giudicotti, EURATOM/ENEA/CNR/Univ. di Padova (Italy)
Luca Lotto, EURATOM/ENEA/CNR/Univ. di Padova (Italy)
Roberto Pasqualotto, EURATOM/ENEA/CNR/Univ. di Padova (Italy)

Published in SPIE Proceedings Vol. 2551:
Photoelectronic Detectors, Cameras, and Systems
C. Bruce Johnson; Ervin J. Fenyves, Editor(s)

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