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Proceedings Paper

Sensing nanometric displacement of a micro-/nano-fiber induced by optical forces by use of white light interferometry
Author(s): Weiqia Qiu; Hankai Huang; Jianhui Yu; Huazhuo Dong; Zhe Chen; Huihui Lu
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Paper Abstract

Sensing the nanometric displacement of a micro-/nano-fiber induced by optical forces is a key technology to study optical forces and optical momentum. When the gap between a micro-/nano-fiber and glass substrate becomes down to micrometer scale or less, a white light interference was observed. The gap changes when optical force arising from the propagating pump light along the micro-/nano-fiber causes a transversal nanometric displacement of a micro-/nanofiber, resulting in movement of the interferometric fringes. Therefore this movement of the interferometric fringes can be used to sense the nanometric displacement of the micro-/nano-fiber induced by optical forces. Experimental results show that the resolutions of this method can reach 7.27nm/pixel for tilted angle 0.8o between the micro-/nano-fiber and substrate. It is concluded that the white light interferometry method is suitable for measuring the weak optical force.

Paper Details

Date Published: 1 July 2015
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96552J (1 July 2015); doi: 10.1117/12.2184393
Show Author Affiliations
Weiqia Qiu, Jinan Univ. (China)
Hankai Huang, Jinan Univ. (China)
Jianhui Yu, Jinan Univ. (China)
Huazhuo Dong, Jinan Univ. (China)
Zhe Chen, Jinan Univ. (China)
Huihui Lu, Jinan Univ. (China)

Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)

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