
Proceedings Paper
Sensing nanometric displacement of a micro-/nano-fiber induced by optical forces by use of white light interferometryFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Sensing the nanometric displacement of a micro-/nano-fiber induced by optical forces is a key technology to study optical forces and optical momentum. When the gap between a micro-/nano-fiber and glass substrate becomes down to micrometer scale or less, a white light interference was observed. The gap changes when optical force arising from the propagating pump light along the micro-/nano-fiber causes a transversal nanometric displacement of a micro-/nanofiber, resulting in movement of the interferometric fringes. Therefore this movement of the interferometric fringes can be used to sense the nanometric displacement of the micro-/nano-fiber induced by optical forces. Experimental results show that the resolutions of this method can reach 7.27nm/pixel for tilted angle 0.8o between the micro-/nano-fiber and substrate. It is concluded that the white light interferometry method is suitable for measuring the weak optical force.
Paper Details
Date Published: 1 July 2015
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96552J (1 July 2015); doi: 10.1117/12.2184393
Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96552J (1 July 2015); doi: 10.1117/12.2184393
Show Author Affiliations
Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)
© SPIE. Terms of Use
