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Proceedings Paper

Spatial filtering velocimeter for vehicle navigation with extended measurement range
Author(s): Xin He; Jian Zhou; Xiaoming Nie; Xingwu Long
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Paper Abstract

The idea of using spatial filtering velocimeter is proposed to provide accurate velocity information for vehicle autonomous navigation system. The presented spatial filtering velocimeter is based on a CMOS linear image sensor. The limited frame rate restricts high speed measurement of the vehicle. To extend measurement range of the velocimeter, a method of frequency shifting is put forward. Theoretical analysis shows that the frequency of output signal can be reduced and the measurement range can be doubled by this method when the shifting direction is set the same with that of image velocity. The approach of fast Fourier transform (FFT) is employed to obtain the power spectra of the spatially filtered signals. Because of limited frequency resolution of FFT, a frequency spectrum correction algorithm, called energy centrobaric correction, is used to improve the frequency resolution. The correction accuracy energy centrobaric correction is analyzed. Experiments are carried out to measure the moving surface of a conveyor belt. The experimental results show that the maximum measurable velocity is about 800deg/s without frequency shifting, 1600deg/s with frequency shifting, when the frame rate of the image is about 8117 Hz. Therefore, the measurement range is doubled by the method of frequency shifting. Furthermore, experiments were carried out to measure the vehicle velocity simultaneously using both the designed SFV and a laser Doppler velocimeter (LDV). The measurement results of the presented SFV are coincident with that of the LDV, but with bigger fluctuation. Therefore, it has the potential of application to vehicular autonomous navigation.

Paper Details

Date Published: 22 June 2015
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252K (22 June 2015); doi: 10.1117/12.2184118
Show Author Affiliations
Xin He, National Univ. of Defense Technology (China)
Jian Zhou, National Univ. of Defense Technology (China)
Xiaoming Nie, National Univ. of Defense Technology (China)
Xingwu Long, National Univ. of Defense Technology (China)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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